The Export of Goods (Control) Order 1994

“6A1    Equipment, Assemblies and Components

Acoustics

6A001 a. Marine acoustic systems, equipment or specially designed components therefor, as follows:

1. Active (transmitting or transmitting-and-receiving) systems, equipment or specially designed components therefor, as follows:

• Note: Sub-head a.1. to this entry does not specify:

a. Depth sounders operating vertically below the apparatus, not including a scanning function exceeding ± 10°, and limited to measuring the depth of water, the distance of submerged or buried objects or fish finding;

b. Acoustic beacons, as follows:

1. Acoustic emergency beacons; or

2. Pingers specially designed for relocating or returning to an underwater position.

a. Wide-swath bathymetric survey systems for sea bed topographic mapping:

1. Designed:

a. To take measurements at an angle exceeding 10° from the vertical; and

b. To measure depths exceeding 600 m below the water surface; and

2. Designed:

a. To incorporate multiple beams any of which is less than 2°; or

b. To provide data accuracies of better than 0.5% of water depth across the swath averaged over the individual measurements within the swath;

b. Object detection or location systems having any of the following:

1. A transmitting frequency below 10 kHz;

2. Sound pressure level exceeding 224 dB (reference 1 micropascal at 1 m) for equipment with an operating frequency in the band from 10 kHz to 24 kHz inclusive;

3. Sound pressure level exceeding 235 dB (reference 1 micropascal at 1m) for equipment with an operating frequency in the band between 24 kHz and 30 kHz;

4. Forming beams of less than 1° on any axis and having an operating frequency of less than 100 kHz;

5. Designed to withstand pressure during normal operation at depths exceeding 1,000 m and having transducers:

a. Dynamically compensated for pressure; or

b. Incorporating other than lead zirconate titanate as the transduction element; or

6. Designed to operate with an unambiguous display range exceeding 5,120 m;

c. Acoustic projectors, including transducers, incorporating piezoelectric, magnetostrictive, electrostrictive, electrodynamic or hydraulic elements operating individually or in a designed combination, having any of the following:

• Notes:

1. The control on export of acoustic projectors, including transducers, specially designed for other equipment is determined by the export control requirements applying to that equipment.

2. Sub-head a.1.c. of this entry does not specify electronic sources which direct the sound vertically only, or mechanical (e.g., air gun or vapour-shock gun) or chemical (e.g., explosive) sources.

1. An instantaneous radiated acoustic power density exceeding 0.01 mW/mm²/Hz for devices operating at frequencies below 10 kHz;

2. A continuously radiated acoustic power density exceeding 0.001 mW/mm²/Hz for devices operating at frequencies below 10 kHz;

• Note: Acoustic power density is obtained by dividing the output acoustic power by the product of the area of the radiating surface and the frequency of operation.

3. Designed to withstand pressure during normal operation at depths exceeding 1,000 m; or

4. Side-lobe suppression exceeding 22 dB;

d. Acoustic systems, equipment or specially designed components for determining the position of surface vessels or underwater vehicles designed:

• Note: Sub-head a.1.d. of this entry includes equipment using coherent signal processing between two or more beacons and the hydrophone unit carried by the surface vessel or underwater vehicle, or capable of automatically correcting speed-of-sound propagation errors for calculation of a point.

1. To operate at a range exceeding 1,000 m with a positioning accuracy of less than 10 m rms when measured at a range of 1,000 m; or

2. To withstand pressure at depths exceeding 1,000 m;

2. Passive (receiving, whether or not related in normal application to separate active equipment) systems, equipment or specially designed components therefor, as follows:

a. Hydrophones (transducers) with any of the following characteristics:

1. Incorporating continuous flexible sensors or assemblies of discrete sensor elements with either a diameter or length less than 20 mm and with a separation between elements of less than 20 mm;

2. Having any of the following sensing elements:

a. Optical fibres;

b. Piezoelectric polymers; or

c. Flexible piezoelectric ceramic materials;

3. Hydrophone sensitivity better than -180 dB at any depth with no acceleration compensation;

4. When designed to operate at depths not exceeding 35 m, hydrophone sensitivity better than -186 dB with acceleration compensation;

5. When designed for normal operation at depths exceeding 35 m, hydrophone sensitivity better than -192 dB with acceleration compensation;

6. When designed for normal operation at depths exceeding 100 m, hydrophone sensitivity better than -204 dB; or

7. Designed for operation at depths exceeding 1,000 m;

• Note: Hydrophone sensitivity is defined as twenty times the logarithm to the base 10 of the ratio of rms output voltage to a 1 V rms reference, when the hydrophone sensor, without a pre-amplifier, is placed in a plane wave acoustic field with an rms pressure of 1 micropascal. For example, a hydrophone of -160 dB (reference 1 V per micropascal) would yield an output voltage of 10⁻⁸ V in such a field, while one of -180 dB sensitivity would yield only 10⁻⁹ V output. Thus, -160 dB is better than -180 dB.

b. Towed acoustic hydrophone arrays with any of the following:

1. Hydrophone group spacing of less than 12.5 m;

2. Hydrophone group spacing of 12.5 m to less than 25 m and designed or able to be modified to operate at depths exceeding 35 m;

• Note: In this sub-head, “Able to be modified” means having provisions to allow a change of the wiring or interconnections to alter hydrophone group spacing or operating depth limits. These provisions are: spare wiring exceeding 10% of the number of wires, hydrophone group spacing adjustment blocks or internal depth limiting devices that are adjustable or that control more than one hydrophone group.

3. Hydrophone group spacing of 25 m or more and designed to operate at depths exceeding 100 m;

4. Heading sensors specified in sub-head a.2.d. of this entry;

5. Non-metallic strength members or longitudinally reinforced array hoses;

6. An assembled array of less than 40 mm in diameter;

7. Multiplexed hydrophone group signals; or

8. Hydrophone characteristics specified in sub-head a.2.a. of this entry;

c. Processing equipment, specially designed for towed acoustic hydrophone arrays, with either of the following:

1. A Fast Fourier or other transform of 1,024 or more complex points in less than 20 ms with no user-accessible programmability; or

2. Time or frequency domain processing and correlation, including spectral analysis, digital filtering and beamforming using Fast Fourier or other transforms or processes with user-accessible programmability;

d. Heading sensors having an accuracy of better than ± 0.5°; and

1. Designed to be incorporated within the array hosing and to operate at depths exceeding 35 m or having an adjustable or removable depth sensing device in order to operate at depths exceeding 35 m; or

2. Designed to be mounted external to the array hosing and having a sensor unit capable of operating with 360° roll at depths exceeding 35 m;

b. Terrestrial geophones capable of conversion for use in marine systems, equipment or specially designed components specified in sub-head a.2.a. of this entry;

c. Correlation-velocity sonar log equipment designed to measure the horizontal speed of the equipment carrier relative to the sea bed at distances between the carrier and the sea bed exceeding 500 m.

6A002 Optical sensors

a.

Optical detectors, as follows(1):

Note: Head a. of this entry does not specify germanium or silicon photodevices.

1.

Space-qualified solid state detectors having any of the following:

a.

1.

A peak response in the wavelength range exceeding 10 nm but not exceeding 300 nm; and

2.

A response of less than 0.1% relative to the peak response at a wavelength exceeding 400 nm;

b.

1.

A peak response in the wavelength range exceeding 900 nm but not exceeding 1,200 nm; and

2.

A response time constant of 95 ns or less; or

c.

A peak response in the wavelength range exceeding 1,200 nm but not exceeding 30,000 nm;

2.

Image intensifier tubes and specially designed components therefor, as follows:

a.

Image intensifier tubes having all of the following:

1.

A peak response in the wavelength range exceeding 400 nm but not exceeding 1,050 nm;

2.

A microchannel plate for electron image amplification with a hole pitch (centre-to-centre spacing) of less than 25 micrometres; and

3.

a.

An S-20, S-25 or multialkali photocathode; or

b.

A GaAs or GaInAs photocathode;

b.

Specially designed components, as follows:

1.

Fibre optic image inverters;

2.

Microchannel plates having both of the following characteristics:

a.

15,000 or more hollow tubes per plate; and

b.

Hole pitch (centre-to-centre spacing) of less than 25 micro-metres;

3.

GaAs or GaInAs photocathodes;

3.

Non-space-qualified focal plane arrays, having any of the following:

Notes:

1.

Linear or two-dimensional multi-element detector arrays are referred to as focal plane arrays.

2.

Sub-head a.3. of this entry includes photoconductive arrays and photovoltaic arrays.

3.

Sub-head a.3. of this entry does not specify silicon focal plane arrays, multi-element (not to exceed 16 elements) encapsulated photoconductive cells or pyroelectric detectors using any of the following:

a.

Lead sulphide;

b.

Triglycine sulphate and variants;

c.

Lead-lanthanum-zirconium titanate and variants;

d.

Lithium tantalate;

e.

Polyvinylidene fluoride and variants;

f.

Strontium barium niobate and variants; or

g.

Lead selenide.

a.

1.

Individual elements with a peak response within the wavelength range exceeding 900 nm but not exceeding 1,050 nm; and

2.

A response time constant of less than 0.5 ns;

b.

1.

Individual elements with a peak response in the wavelength range exceeding 1,050 nm but not exceeding 1,200 nm; and

2.

A response time constant of 95 ns or less; or

c.

Individual elements with a peak response in the wavelength range exceeding 1,200 nm but not exceeding 30,000 nm;

4.

Non-space-qualified single-element or non-focal-plane multi-element semi-conductor photodiodes or phototransistors having both of the following:

a.

A peak response in the wavelength range exceeding 1,200 nm but not exceeding 30,000 nm; and

b.

A response time constant of 0.5 ns or less;

b.

Multispectral imaging sensors designed for remote sensing applications, having either of the following characteristics:

1.

An Instantaneous-Field-Of-View (IFOV) of less than 200 microradians; or

2.

Specified for operation in the wavelength range exceeding 400 nm but not exceeding 30,000 nm; and

a.

Providing output imaging data in digital format; and

b.

1.

Space-qualified; or

2.

Designed for airborne operation, using other than silicon detectors, and having an IFOV of less than 2.5 milliradians;

c.

Direct view imaging equipment operating in the visible or infrared spectrum, incorporating either of the following:

1.

Image intensifier tubes having the characteristics listed in sub-head a.2.a. of this entry; or

2.

Focal plane arrays having the characteristics listed in sub-head a.3. of this entry;

Notes:

a.

In this entry “direct view” means imaging equipment, operating in the visible or infrared spectrum, that presents a visual image to a human observer without converting the image into an electronic signal for television display, and that cannot record or store the image photographically, electronically or by any other means.

b.

Head c. of this entry does not specify the following equipment incorporating other than GaAs or GaInAs photocathodes:

a.

Industrial or civilian intrusion alarm, traffic or industrial movement control or counting systems;

b.

Medical equipment;

c.

Industrial equipment used for inspection, sorting or analysis of the properties of materials;

d.

Flame detectors for industrial furnaces;

e.

Equipment specially designed for laboratory use.

d.

Special support components for optical sensors, as follows:

1.

Space-qualified cryocoolers;

2.

Non-space-qualified cryocoolers with a cooling source temperature below 218 K (-55°C), as follows:

a.

Closed cycle with a specified Mean-Time-To-Failure (MTTF), or Mean-Time-Between-Failures (MTBF), exceeding 2,500 hours;

b.

Joule-Thomson (JT) self-regulating minicoolers with bore (outside) diameters of less than 8 mm;

3.

Optical sensing fibres:

a.

Specially fabricated either compositionally or structurally, or modified by coating, to be acoustically, thermally, inertially, electromagnetically or nuclear radiation sensitive; or

b.

Modified structurally to have a beat length of less than 50 mm (high birefringence).

6A003 Cameras(2)

a. Instrumentation cameras, as follows:

1. High-speed cinema recording cameras using any film format from 8 mm to 16 mm inclusive, in which the film is continuously advanced throughout the recording period, and that are capable of recording at framing rates exceeding 13,150 frames per second;

• Note: This sub-head does not specify cinema recording cameras for normal civil purposes.

2. Mechanical high speed cameras, in which the film does not move, capable of recording at rates exceeding 1,000,000 frames per second for the full framing height of 35 mm film, or at proportionately higher rates for lesser frame heights, or at proportionately lower rates for greater frame heights;

3. Mechanical or electronic streak cameras with writing speeds exceeding 10 mm per microsecond;

4. Electronic framing cameras having a speed exceeding 1,000,000 frames per second;

5. Electronic cameras having:

a. An electronic shutter speed (gating capability) of less than 1 microsecond per full frame; and

b. A read out time allowing a framing rate of more than 125 full frames per second;

b. Imaging cameras(3), as follows:

• Note: Head b. of this entry does not specify television or video cameras specially designed for television broadcasting.

1. Video cameras incorporating solid state sensors, having any of the following:

a. More than 4 × 10⁶ active pixels per solid state array for monochrome (black and white) cameras;

b. More than 4 × 10⁶ active pixels per solid state array for colour cameras incorporating three solid state arrays; or

c. More than 12 × 10⁶ active pixels for solid state array colour cameras incorporating one solid state array;

2. Scanning cameras and scanning camera systems:

a. Incorporating linear detector arrays with more than 8,192 elements per array; and

b. Having mechanical scanning in one direction;

3. Incorporating image intensifiers specified in sub-head a.2.a. of entry 6A002;

4. Incorporating focal plane arrays specified in sub-head a.3. of entry 6A002.

• Note: For cameras specially designed or modified for underwater use, see heads d. and e. of entry 8A002.

6A004 Optics

a. Optical mirrors (reflectors), as follows:

1. Deformable mirrors with either continuous or multi-element surfaces, and specially designed components therefor, capable of dynamically repositioning portions of the surface of the mirror at rates exceeding 100 Hz;

2. Lightweight monolithic mirrors with an average equivalent density of less than 30 kg/m² and a total weight exceeding 10 kg;

3. Lightweight composite or foam mirror structures with an average equivalent density of less than 30 kg/m² and a total weight exceeding 2 kg;

4. Beam steering mirrors more than 100 mm in diameter or length of major axis which maintain a flatness of lambda/2 or better (lambda is equal to 633 nm) with a control bandwidth exceeding 100 Hz;

b. Optical components made from zinc selenide (ZnSe) or zinc sulphide (ZnS) with transmission in the wavelength range exceeding 3,000 nm but not exceeding 25,000 nm and either of the following:

1. Exceeding 100 cm³ in volume; or

2. Exceeding 80 mm in diameter or length of major axis and 20 mm in thickness (depth);

c. Space-qualified components for optical systems, as follows:

1. Lightweighted to less than 20% equivalent density compared with a solid blank of the same aperture and thickness;

2. Substrates, substrates with surface coatings (single-layer or multi-layer, metallic or dielectric, conducting, semiconducting or insulating) or with protective films;

3. Segments or assemblies of mirrors designed to be assembled in space into an optical system with a collecting aperture equivalent to or larger than a single optic 1 metre in diameter;

4. Manufactured from composite materials having a coefficient of linear thermal expansion equal to or less than 5 × 10₋₆ in any coordinate direction;

d. Optical filters, as follows:

1. For wavelengths longer than 250 nm, comprised of multi-layer optical coatings and having either of the following:

a. Bandwidths equal to or less than 1 nm Full Width Half Intensity (FWHI) and peak transmission of 90% or more; or

b. Bandwidths equal to or less than 0.1 nm FWHI and peak transmission of 50% or more;

• Note: Sub-head d.1. of this entry does not specify optical filters with fixed air gaps or Lyot-type filters.

2. For wavelengths longer than 250 nm, having all of the following:

a. Tunable over a spectral range of 500 nm or more;

b. Instantaneous optical bandpass of 1.25 nm or less;

c. Wavelength resettable within 0.1 ms to an accuracy of 1 nm or better within the tunable spectral range; and

d. A single peak transmission of 91% or more;

3. Optical opacity switches (filters) with a field of view of 30° or wider and a response time equal to or less than 1 ns;

e. Optical control equipment, as follows:

1. Specially designed to maintain the surface figure or orientation of the space-qualified components specified in sub-heads c.1. or c.3. of this entry;

2. Having steering, tracking, stabilization or resonator alignment bandwidths equal to or more than 100 Hz and an accuracy of 10 microradians or less;

3. Gimbals having a maximum slew exceeding 5°, a bandwidth equal to or more than 100 Hz, and either of the following:

a.

1.

Exceeding 0.15 m but not exceeding 1 m in diameter or major axis length;

2.

Capable of angular accelerations exceeding 2 radians/s²; and

3.

Having angular pointing errors equal to or less than 200 microradians; or

b.

1.

Exceeding 1 m in diameter or major axis length;

2.

Capable of angular accelerations exceeding 0.5 radians/²; and

3.

Having angular pointing errors equal to or less than 200 microradians;

4. Specially designed to maintain the alignment of phased array or phased segment mirror systems consisting of mirrors with a segment diameter or major axis length of 1 m or more;

f. Fluoride fibre cable, or optical fibres therefor, having an attenuation of less than 4 dB/km in the wavelength range exceeding 1,000 nm but not exceeding 3,000 nm.

6A005 Lasers, components and optical equipment, as follows(4):

• Notes:

  1.

  Pulsed lasers include those that run in a continuous wave (CW) mode with pulses superimposed.

  2.

  Pulse-excited lasers include those that run in a continuously excited mode with pulse excitation superimposed.

  3.

  The status of Raman lasers is determined by the parameters of the pumping source lasers. The pumping source lasers can be any of the lasers described below.

a. Gas lasers, as follows:

1. Excimer lasers having any of the following:

a. An output wavelength not exceeding 150 nm and:

1. An output energy exceeding 50 mJ per pulse; or

2. An average or CW output power exceeding 1 W;

b. An output wavelength exceeding 150 nm but not exceeding 190 nm and:

1. An output energy exceeding 1.5 J per pulse; or

2. An average or CW output power exceeding 120 W;

c. An output wavelength exceeding 190 nm but not exceeding 360 nm and:

1. An output energy exceeding 10 J per pulse; or

2. An average or CW output power exceeding 500 W; or

d. An output wavelength exceeding 360 nm and:

1. An output energy exceeding 1.5 J per pulse; or

2. An average or CW output power exceeding 30 W;

2. Metal vapour lasers, as follows:

a. Copper (Cu) lasers with an average or CW output power exceeding 20 W;

b. Gold (Au) lasers with an average or CW output power exceeding 5 W;

c. Sodium (Na) lasers with an output power exceeding 5 W;

d. Barium (Ba) lasers with an average or CW output power exceeding 2 W;

3. Carbon monoxide (CO) lasers having either:

a. An output energy exceeding 2 J per pulse and a pulsed peak power exceeding 5 kW; or

b. An average or CW output power exceeding 5 kW;

4. Carbon dioxide (CO₂) lasers having any of the following:

a. A CW output power exceeding 10 kW;

b. A pulsed output with a pulse duration exceeding 10 microseconds and:

1. An average output power exceeding 10 kW; or

2. A pulsed peak power exceeding 100 kW; or

c. A pulsed output with a pulse duration equal to or less than 10 microseconds and:

1. A pulse energy exceeding 5 J per pulse and peak power exceeding 2.5 kW; or

2. An average output power exceeding 2.5 kW;

5. Chemical lasers, as follows:

a. Hydrogen Fluoride (HF) lasers;

b. Deuterium Fluoride (DF) lasers;

c. Transfer lasers:

1. Oxygen Iodine (O₂-I) lasers;

2. Deuterium Fluoride-Carbon dioxide (DF-CO₂) lasers;

6. Gas discharge and ion lasers, i.e., krypton ion or argon ion lasers, as follows:

a. An output energy exceeding 1.5 J per pulse and a pulsed peak power exceeding 50 W; or

b. An average or CW output power exceeding 50 W; or

7. Other gas lasers, except nitrogen lasers, having any of the following:

a. An output wavelength not exceeding 150 nm and:

1. An output energy exceeding 50 mJ per pulse and a pulsed peak power exceeding 1 W; or

2. An average or CW output power exceeding 1 W;

b. An output wavelength exceeding 150 nm but not exceeding 800 nm and:

1. An output energy exceeding 1.5 J per pulse and a pulsed peak power exceeding 30 W; or

2. An average or CW output power exceeding 30 W;

c. An output wavelength exceeding 800 nm but not exceeding 1,400 nm and:

1. An output energy exceeding 0.25 J per pulse and a pulsed peak power exceeding 10 W; or

2. An average or CW output power exceeding 10 W; or

d. An output wavelength exceeding 1,400 nm and an average or CW output power exceeding 1 W;

b. Semiconductor lasers, as follows:

• Notes:

  1.

  Semiconductor lasers are commonly called laser diodes.

  2.

  The control on export of semiconductor lasers specially designed for other equipment is determined by the export control requirements applying to that other equipment.

1. Individual, single-transverse mode semiconductor lasers having:

a. An average output power exceeding 100 mW; or

b. A wavelength exceeding 1,050 nm;

2. Individual, multiple-transverse mode semiconductor lasers, or arrays of individual semiconductor lasers, having:

a. An output energy exceeding 500 microjoules per pulse and a pulsed peak power exceeding 10 W;

b. An average or CW output power exceeding 10 W; or

c. A wavelength exceeding 1,050 nm;

c. Solid state lasers, as follows:

1. Tunable lasers having any of the following:

• Note: Sub-head c.1. of this entry includes titanium-sapphire (Ti: Al²O³), thulium-YAG (Tm: YAG), thulium-YSGG (Tm: YSGG), alexandrite (Cr: BeAl²O⁴) and colour centre lasers.

a. An output wavelength less than 600 nm and:

1. An output energy exceeding 50 mJ per pulse and a pulsed peak power exceeding 1 W; or

2. An average or CW output power exceeding 1 W;

b. An output wavelength of 600 nm or more but not exceeding 1,400 nm and:

1. An output energy exceeding 1 J per pulse and a pulsed peak power exceeding 20 W; or

2. An average or CW output power exceeding 20 W; or

c. An output wavelength exceeding 1,400 nm and:

1. An output energy exceeding 50 mJ per pulse and a pulsed peak power exceeding 1 W; or

2. An average or CW output power exceeding 1 W;

2. Non-tunable lasers, as follows:

• Note: Sub-head c.2. of this entry includes atomic transition solid state lasers.

a. Ruby lasers having an output energy exceeding 20 J per pulse;

b. Neodymium glass lasers, as follows:

1. Q-switched lasers having:

a. An output energy exceeding 20 J but not exceeding 50 J per pulse and an average output power exceeding 10 W; or

b. An output energy exceeding 50 J per pulse;

2. Non-Q-switched lasers having:

a. An output energy exceeding 50 J but not exceeding 100 J per pulse and an average output power exceeding 20 W; or

b. An output energy exceeding 100 J per pulse;

c. Neodymium-doped (other than glass) lasers(5), as follows, with an output wavelength exceeding 1,000 nm but not exceeding 1,100 nm:

• Note: For Neodymium-doped (other than glass) lasers having an output wavelength not exceeding 1,000 nm or exceeding 1,100 nm, see sub-head c.2.d. of this entry.

1. Pulse excited, mode-locked, Q-switched lasers with a pulse duration of less than 1 ns and:

a. A peak power exceeding 5 GW;

b. An average output power exceeding 10 W; or

c. A pulsed energy exceeding 0.1 J;

2. Pulse-excited, Q-switched lasers, with a pulse duration equal to or more than 1 ns, and:

a. A single-transverse mode output with:

1. A peak power exceeding 100 MW;

2. An average output power exceeding 20 W; or

3. A pulsed energy exceeding 2 J; or

b. A multiple-transverse mode output with:

1. A peak power exceeding 200 MW;

2. An average output power exceeding 50 W; or

3. A pulsed energy exceeding 2 J;

3. Pulse-excited, non-Q-switched lasers, having:

a. A single-transverse mode output with:

1. A peak power exceeding 500 kW; or

2. An average output power exceeding 150 W; or

b. A multiple-transverse mode output with:

1. A peak power exceeding 1 MW; or

2. An average power exceeding 500 W;

4. Continuously excited lasers having:

a. A single-transverse mode output with:

1. A peak power exceeding 500 kW; or

2. An average or CW output power exceeding 150 W; or

b. A multiple-transverse mode output with:

1. A peak power exceeding 1 MW; or

2. An average or CW output power exceeding 500 W;

d. Other non-tunable lasers, having any of the following:

1. A wavelength less than 150 nm and:

a. An output energy exceeding 50 mJ per pulse and a pulsed peak power exceeding 1 W; or

b. An average or CW output power exceeding 1 W;

2. A wavelength of 150 nm or more but not exceeding 800 nm and:

a. An output energy exceeding 1.5 J per pulse and a pulsed peak power exceeding 30 W; or

b. An average or CW output power exceeding 30 W;

3. A wavelength exceeding 800 nm but not exceeding 1,400 nm, as follows:

a. Q-switched lasers with:

1. An output energy exceeding 0.5 J per pulse and a pulsed peak power exceeding 50 W; or

2. An average output power exceeding:

a. 10 W for single-mode lasers;

b. 30 W for multimode lasers;

b. Non-Q-switched lasers with:

1. An output energy exceeding 2 J per pulse and a pulsed peak power exceeding 50 W; or

2. An average or CW output power exceeding 50 W; or

4. A wavelength exceeding 1,400 nm and:

a. An output energy exceeding 100 mJ per pulse and a pulsed peak power exceeding 1 W; or

b. An average or CW output power exceeding 1 W;

d. Dye and other liquid lasers, having any of the following:

1. A wavelength less than 150 nm and:

a. An output energy exceeding 50 mJ per pulse and a pulsed peak power exceeding 1 W; or

b. An average or CW output power exceeding 1 W;

2. A wavelength of 150 nm or more but not exceeding 800 nm and:

a. An output energy exceeding 1.5 J per pulse and a pulsed peak power exceeding 20 W;

b. An average or CW output power exceeding 20 W; or

c. A pulsed single longitudinal mode oscillator with an average output power exceeding 1 W and a repetition rate exceeding 1 kHz if the pulse duration is less than 100 ns;

3. A wavelength exceeding 800 nm but not exceeding 1,400 nm and:

a. An output energy exceeding 0.5 J per pulse and a pulsed peak power exceeding 10 W; or

b. An average or CW output power exceeding 10 W; or

4. A wavelength exceeding 1,400 nm and:

a. An output energy exceeding 100 mJ per pulse and a pulsed peak power exceeding 1 W; or

b. An average or CW output power exceeding 1 W;

e. Free electron lasers;

f. Components, as follows:

1. Mirrors cooled either by active cooling or by heat pipe cooling, 1 mm or less below the reflective surface;

• Note: Active cooling is a cooling technique for optical components using flowing fluids within the subsurface of the optical component to remove heat from the optic.

2. Optical mirrors or transmissive or partially transmissive optical or electro-optical components specially designed for use with specified lasers;

g. Optical equipment(6), as follows:

1. Dynamic wavefront (phase) measuring equipment capable of mapping at least 50 positions on a beam wavefront with:

a. Frame rates equal to or more than 100 Hz and phase discrimination of at least 5% of the beam’s wavelength; or

b. Frame rates equal to or more than 1,000 Hz and phase discrimination of at least 20% of the beam’s wavelength;

2. Laser diagnostic equipment capable of measuring Super-High Power Laser (SHPL) system angular beam steering errors of equal to or less than 10 microradians;

3. Optical equipment, assemblies or components specially designed for a phased-array SHPL system for coherent beam combination to an accuracy of Lambda/10 at the designed wavelength, or 0.1 micrometre, whichever is the smaller;

4. Projection telescopes specially designed for use with SHPL systems.

6A006 Magnetometers, magnetic gradiometers, intrinsic magnetic gradiometers and compensation systems, and specially designed components therefor, as follows:

• Note: This entry does not specify instruments specially designed for biomagnetic measurements for medical diagnostics, unless they incorporate unembedded sensors specified in head h. of this entry.

a. Magnetometers using superconductive, optically pumped or nuclear precession (proton/Overhauser) technology having a noise level (sensitivity) lower (better) than 0.05 nT rms per square root Hz;

b. Induction coil magnetometers having a noise level (sensitivity) lower (better) than:

1. 0.05 nT rms per square root Hz at frequencies of less than 1 Hz;

2. 1 × 10⁻³ nT rms per square root Hz at frequencies of 1 Hz or more but not exceeding 10 Hz; or

3. 1 × 10⁻⁴ nT rms per square root Hz at frequencies exceeding 10 Hz;

c. Fibre optic magnetometers having a noise level (sensitivity) lower (better) than 1 nT rms per square root Hz;

d. Magnetic gradiometers using multiple magnetometers specified in heads a., b. or c. of this entry;

e. Fibre optic intrinsic magnetic gradiometers having a magnetic gradient field noise level (sensitivity) lower (better) than 0.3 nT/m rms per square root Hz;

f. Intrinsic magnetic gradiometers, using technology other than fibre-optic technology, having a magnetic gradient field noise level (sensitivity) lower (better) than 0.015 nT/m rms per square root Hz;

g. Magnetic compensation systems for magnetic sensors designed for operation on mobile platforms;

h. Superconductive electromagnetic sensors, containing components manufactured from superconductive materials, as follows:

1. Designed for operation at temperatures below the critical temperature of at least one of their superconductive constituents (including Josephson effect devices or superconductive quantum interference devices (SQUIDS));

2. Designed for sensing electromagnetic field variations at frequencies of 1 kHz or less; and

3. Having any of the following characteristics:

a. Incorporating thin-film SQUIDS with a minimum feature size of less than 2 micrometres and with associated input and output coupling circuits;

b. Designed to operate with a magnetic field slew rate exceeding 1 × 10⁶ magnetic flux quanta per second;

c. Designed to function without magnetic shielding in the earth’s ambient magnetic field; or

d. Having a temperature coefficient less (smaller) than 0.1 magnetic flux quantum/K.

6A007 Gravity meters (gravimeters) and gravity gradiometers, as follows(7):

a. Gravity meters for ground use having a static accuracy of less (better) than 10 microgal;

• Note: Head a. of this entry does not specify ground gravity meters of the quartz element (Worden) type.

b. Gravity meters for mobile platforms for ground, marine, submersible, space or airborne use having:

1. A static accuracy of less (better) than 0.7 milligal; and

2. An in-service (operational) accuracy of less (better) than 0.7 milligal with a time-to-steady-state registration of less than 2 minutes under any combination of attendant corrective compensations and motional influences;

c. Gravity gradiometers.

6A008 Radar systems, equipment and assemblies having any of the following characteristics, and specially designed components therefor(8):

• Note: This entry does not specify:

  a.

  Secondary surveillance radar (SSR);

  b.

  Car radar designed for collision prevention;

  c.

  Displays or monitors used for air traffic control (ATC) having no more than 12 resolvable elements per mm;

  d.

  Meteorological (weather) radar.

a. Operating at frequencies from 40 GHz to 230 GHz and having an average output power exceeding 100 mW;

b. Having a tunable bandwidth exceeding ± 6.25% of the centre operating frequency;

• Note: The centre operating frequency equals one half of the sum of the highest plus the lowest specified operating frequencies.

c. Capable of operating simultaneously on more than two carrier frequencies;

d. Capable of operating in synthetic aperture (SAR), inverse synthetic aperture (ISAR) or sidelooking airborne (SLAR) radar mode;

e. Incorporating electronically steerable phased array antennae;

f. Capable of heightfinding non-cooperative targets;

• Note: Head f. of this entry does not specify precision approach radar equipment (PAR) conforming with International Civil Aviation Organisation (ICAO) standards published by ICAO in Annex 10 of Volume 1.

g. Designed specially for airborne (balloon or airframe mounted) operation and having Doppler signal processing for the detection of moving targets;

h. Employing processing of radar signals using:

1. Radar spread spectrum techniques; or

2. Radar frequency agility techniques;

i. Providing ground-based operation with a maximum instrumented range exceeding 185 km;

• Note: Head i. of this entry does not specify;

  a.

  Fishing ground surveillance radar;

  b.

  Ground radar equipment specially designed for enroute air traffic control and software specially designed for the use thereof, provided:

  1.

  It has a maximum instrumented range of 500 km or less;

  2.

  It is configured so that radar target data can be transmitted only one way from the radar site to one or more civil ATC centres;

  3.

  It contains no provisions for remote control of the radar scan rate from the enroute ATC centre; and

  4.

  It is to be permanently installed.

• N.B.: The use software must be limited to object code and the minimum amount of source code necessary for installation, operation or maintenance.

j. Laser radar or Light Detection and Ranging (LIDAR) equipment, having either of the following:

1. Space-qualified; or

2. Employing coherent heterodyne or homodyne detection techniques and having an angular resolution of less (better) than 20 microradians;

• Note: Head j. of this entry does not specify LIDAR equipment specially designed for surveying or for meteorological observation.

k. Having signal processing sub-systems using pulse compression with:

1. A pulse compression ratio exceeding 150; or

2. A pulse width of less than 200 ns; or

l. Having data processing sub-systems with:

1. Automatic target tracking providing, at any antenna rotation, the predicted target position beyond the time of the next antenna beam passage;

• Note: Sub-head l.1. of this entry does not specify conflict alert capability in ATC systems, or marine or harbour radar.

2. Calculation of target velocity from primary radar having non-periodic (variable) scanning rates;

3. Processing for automatic pattern recognition (feature extraction) and comparison with target characteristic data bases (waveforms or imagery) to identify or classify targets; or

4. Superposition and correlation, or fusion, of target data from two or more geographically dispersed and interconnected radar sensors to enhance and discriminate targets.

• Note: Sub-head l.4 of this entry does not specify systems, equipment and assemblies used for marine traffic control.

6A102 Radiation hardened detectors, other than those specified in entry 6A002, for use in protecting against nuclear effects (e.g. electromagnetic pulse (EMP), X-rays, combined blast and thermal effects), and usable for missiles, designed or rated to withstand radiation levels which meet or exceed a total irradiation dose of 5 × 10⁵ rads (Si).

In this entry, “a detector” means a mechanical, electrical, optical or chemical device that automatically identifies and records, or registers a stimulus such as an environmental change in pressure or temperature, an electrical or electromagnetic signal or radiation from a radioactive material.

6A107 Specially designed components for gravity meters and gravity gradiometers specified in heads b. and c. of entry 6A007.

6A108 Radar systems and tracking systems, other than those specified in entry 6A008, as follows:

a. Radar and laser radar systems designed or modified for use in systems specified in entries 9A004 or 9A104;

b. Precision tracking systems, usable for missiles, as follows:

1. Tracking systems which use a code translator in conjunction with either surface or airborne references or navigation satellite systems to provide real-time measurements of in-flight position and velocity;

2. Range instrumentation radars including associated optical/infrared trackers with all of the following capabilities:

a. angular resolution better than 3 milliradians (0.5 mils);

b. range of 30 km or greater with a range resolution better than 10 m rms;

c. velocity resolution better than 3 m/s.

6A202 Photomultiplier tubes with a photocathode area of greater than 20 cm² having an anode pulse rise time of less than 1 ns.

6A203 Cameras and components, other than those specified in entry 6A003, as follows:

a. Mechanical rotating mirror cameras and specially designed components therefor, as follows:

1. Mechanical framing cameras with recording rates greater than 225,000 frames per second;

2. Streak cameras with writing speeds greater than 0.5 mm per microsecond;

Note: Components of such cameras include specially designed synchronizing electronics and specially designed rotor assemblies (consisting of turbines, mirrors and bearings).

b. Electronic streak and framing cameras and tubes, as follows:

1. Electronic streak cameras capable of 50 ns or less time resolution and streak tubes therefor;

2. Electronic (or electronically shuttered) framing cameras capable of 50 ns or less frame exposure time;

3. Framing tubes and solid-state imaging devices for use with cameras specified in sub-head b.2. of this entry, as follows:

a. Proximity focused image intensifier tubes having the photocathode deposited on a transparent conductive coating to decrease photocathode sheet resistance;

b. Gate silicon intensifier target (SIT) videcon tubes, where a fast system allows gating the photoelectrons from the photocathode before they impinge on the SIT plate;

c. Kerr or pockel cell electro-optical shuttering; or

d. Other framing tubes and solid-state imaging devices having a fast-image gating time of less than 50 ns specially designed for cameras specified in sub-head b.2. of this entry;

c. Radiation-hardened TV cameras specially designed or rated as radiation hardened to withstand greater than 5 × 10⁴ grays (Si)(5 × 10⁶ rad (Si)) without operational degradation and specially designed lenses used therein.

6A205 Lasers, other than those specified in entry 6A005, as follows:

a. Argon ion lasers with greater than 40 W average output power operating at wavelengths between 400 nm and 515 nm;

b. Tunable pulsed single-mode dye oscillators capable of an average power output of greater than 1 W, a repetition rate greater than 1 kHz, a pulse less than 100 ns, and a wavelength between 300 nm and 800 nm;

c. Tunable pulsed dye laser amplifiers and oscillators, with an average power output of greater than 30W, a repetition rate greater than 1 kHz, a pulse width less than 100 ns, and a wavelength between 300 nm and 800 nm;

• except:

• Single mode oscillators;

d. Pulsed carbon dioxide lasers with a repetition rate greater than 250 Hz, an average power output of greater than 500 W, and a pulse of less than 200 ns operating at wavelengths between 9,000 nm and 11,000 nm;

e. Para-hydrogen Raman shifters designed to operate at 16 micrometres output wavelength and at a repetition rate greater than 250 Hz.

6A225 Velocity interferometers for measuring velocities in excess of 1 km/s during time intervals of less than 10 microsecond (VISARs, Doppler laser interferometers (DLIs), etc.).

6A226 Pressure sensors, as follows:

a. Manganin gauges for pressures greater than 100 kilobars; or

b. Quartz pressure transducers for pressures greater than 100 kilobars.

(1)

See also entry 6A102.

(2)

See also entry 6A203.

(3)

See heads d. and e. of entry 8A002 for cameras specially modified for underwater use.

(4)

See also entry 6A205.

(5)

See also sub-head c.2.d. of this entry.

(6)

See head d. of entry ML23 of Group 1 of Part III of this Schedule for shared aperture optical elements capable of operating in Super-High Power Laser applications.

(7)

See also entry 6A107.

(8)

See also entry 6A108.